Spherical aberration-corrected transmission electron microscope (JEM-2200FS)
JEOL Ltd.
# Mapping
# Elemental analysis
# Spherical aberration coefficient correction
# Transmission electron microscope
# 透過電子顕微鏡
# 球面収差係数補正
# 元素分析
# マッピング
- Spatial resolution 0.1 nm (after aberration correction)
- Accelerating voltage 200 kV
- Electron beam spectrometer Ω-type filter / Energy resolution 0.8 eV
- Spherical aberration-corrected transmission electron microscope (JEM-2200FS)
- CCD Camera 2048x2048 pixel
- Aberration correction device CEOS Cs correction device (for TEM mode)
- Features: Measurement in both TEM/STEM modes is possible. This general-purpose analytical electron microscope can use various types of sample holders, such as sample heating and cryogenic holders.
Installation Location
33
Cryogenic Ultra High-Resolution Electron Microscope Room 9-1
User Guide
Kyoto University
Use -by-the-hour
Technical Agencies
Technical Assistance
You must release a result
Other Research Institutes
Use -by-the-hour
Technical Agencies
Technical Assistance
You must release a result
Companies, etc.
Use -by-the-hour
Technical Agencies
Technical Assistance
You must release a result
-
Use -by-the-hour
- Users perform measurements on an hourly basis
-
Technical Agencies
- Users should submit samples etc. Technical staff will measure them.
-
Technical assistance
- Basically, users operate the device, but an assistant attends the use of the device.
User Guide
Kyoto University Microstructural Characterization Platform
https://tem.nanoplat.cpier.kyoto-u.ac.jp/
https://tem.nanoplat.cpier.kyoto-u.ac.jp/
Inquiries
Division of Electron Microscopy and Crystal Chemistry,Institute for Chemical Research
- arim＊eels.kuicr.kyoto-u.ac.jp
Please change 「＊」 to 「@」 and send.