Spherical aberration-corrected transmission electron microscope (JEM-2200FS)

Model

JEM-2200FS

Manufacturer

JEOL Ltd.

Specification

Spatial resolution 0.1 nm (after aberration correction)Accelerating voltage 200 kVElectron beam spectrometer Ω-type filter / Energy resolution 0.8 eVSpherical aberration-corrected transmission electron microscope (JEM-2200FS)CCD Camera 2048x2048 pixelAberration correction device CEOS Cs correction device (for TEM mode)Features: Measurement in both TEM/STEM modes is possible. This general-purpose analytical electron microscope can use various types of sample holders, such as sample heating and cryogenic holders.

Location

Institute for Chemical Research Joint Research Laboratory　CL-107

Installation Year

2023

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Overview

Spatial resolution 0.1 nm (after aberration correction)
Accelerating voltage 200 kV
Electron beam spectrometer Ω-type filter / Energy resolution 0.8 eV
Spherical aberration-corrected transmission electron microscope (JEM-2200FS)
CCD Camera 2048×2048 pixel
Aberration correction device CEOS Cs correction device (for TEM mode)
Features: Measurement in both TEM/STEM modes is possible. This general-purpose analytical electron microscope can use various types of sample holders, such as sample heating and cryogenic holders.

Responsible department

Spatial resolution 0.1 nm (after aberration correction)
Accelerating voltage 200 kV
Electron beam spectrometer Ω-type filter / Energy resolution 0.8 eV
Spherical aberration-corrected transmission electron microscope (JEM-2200FS)
CCD Camera 2048×2048 pixel
Aberration correction device CEOS Cs correction device (for TEM mode)
Features: Measurement in both TEM/STEM modes is possible. This general-purpose analytical electron microscope can use various types of sample holders, such as sample heating and cryogenic holders.

Available Users

Kyoto University
Use -by-the-hour Technical Agencies Technical Assistance
You must release a result

Other Research Institutes
Use -by-the-hour Technical Agencies Technical Assistance
You must release a result

Companies, etc.
Use -by-the-hour Technical Agencies Technical Assistance
You must release a result

Notes

Users should submit samples etc. Technical staff will measure them.

Usage rules

Kyoto University Microstructural Characterization Platform
http://tem.nanoplat.cpier.kyoto-u.ac.jp/

Inquiries

Division of Electron Microscopy and Crystal Chemistry,Institute for Chemical Research
MAIL
arim*eels.kuicr.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.

USACO/Katsura Yui/MaCBES
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