JPEN

Low acceleration atomic resolution analytical electron microscope with monochromator (JEM-ARM200F))

JEOL Ltd.
  • Accelerating voltage 200 kV, 60 kV
  • Monochromator
  • Double Wien filter
  • Spherical aberration correction device
  • Made by CEOS
  • Energy filter
  • Gatan966 QuantumERS
  • EDX system
  • JED-2300T SDD100GV (manufactured by JEOL)
  • Features: High energy resolution EELS measurement and elemental mapping using EDX are possible.
Installation Location
32 Installation Location 32 1st floor of the Ultra-High Resolution Spectroscopic Electron Microscope Building
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User Guide

Kyoto University
Technical Agencies
Technical Assistance
Device Use

You must release a result

Other Research Institutes
Technical Agencies
Technical Assistance
Device Use

You must release a result

Companies, etc.
Technical Agencies
Technical Assistance
Device Use

You must release a result

Technical Agencies
Users should submit samples etc. Technical staff will measure them.
Technical assistance
Basically, users operate the device, but an assistant attends the use of the device.
Device Use
A joint research agreement must be signed (Prior consultation is possible before applying for a public offering)
User Guide
to University Microstructural Characterization Platform
※* For details on how to apply, please refer to the device's website.
http://tem.nanoplat.cpier.kyoto-u.ac.jp/

Inquiries
Division of Electron Microscopy and Crystal Chemistry,Institute for Chemical Research
TEL
0774-38-3053
MAIL
arim*eels.kuicr.kyoto-u.ac.jp

Please change 「*」 to 「@」 and send.

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