Low acceleration atomic resolution analytical electron microscope with monochromator (JEM-ARM200F))

Model

JEM-ARM200F

Manufacturer

JEOL Ltd.

Specification

Accelerating voltage 200 kV, 60 kVMonochromatorDouble Wien filterSpherical aberration correction deviceMade by CEOSEnergy filterGatan966 QuantumERSEDX systemJED-2300T SDD100GV (manufactured by JEOL)Features: High energy resolution EELS measurement and elemental mapping using EDX are possible.

Location

Institute for Chemical Research 1st floor of the Ultra-High Resolution Spectroscopic Electron Microscope Building

Installation Year

2013

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Overview

Accelerating voltage 200 kV, 60 kV
Monochromator
Double Wien filter
Spherical aberration correction device
Made by CEOS
Energy filter
Gatan966 QuantumERS
EDX system
JED-2300T SDD100GV (manufactured by JEOL)
Features: High energy resolution EELS measurement and elemental mapping using EDX are possible.

Responsible department

Installation Location 32 1st floor of the Ultra-High Resolution Spectroscopic Electron Microscope Building

Available Users

Kyoto University
Technical Agencies Technical Assistance Device Use
You must release a result

Other Research Institutes
Technical Agencies Technical Assistance Device Use
You must release a result

Companies, etc.
Technical Agencies Technical Assistance Device Use
You must release a result

Notes

Users should submit samples etc. Technical staff will measure them.

Usage rules

to University Microstructural Characterization Platform
※* For details on how to apply, please refer to the device’s website.
http://tem.nanoplat.cpier.kyoto-u.ac.jp/

Inquiries

Division of Electron Microscopy and Crystal Chemistry,Institute for Chemical Research
TEL
0774-38-3053
MAIL
arim*eels.kuicr.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.

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