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Marcus-type high-frequency glow discharge surface analyzer (GDS) GD-Profiler

Model
(GDS) GD-Profiler2
Manufacturer
HORIBA, Ltd.
Specification
Rapid surface analysis and surface analysis of non-conductive materials are also possible.Pulse sputtering (patented) enables low-damage, high-resolution measurements.It can be used as a pretreatment and etching machine for microscopic observation.Bulk analysis (quantitative analysis of solid materials) is also possible.
Location
Institute of Advanced Energy North Building 2 (partially located in the DuET experiment building in North Building 1)
Installation Year
2013
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Overview

Rapid surface analysis and surface analysis of non-conductive materials are also possible.
Pulse sputtering (patented) enables low-damage, high-resolution measurements.
It can be used as a pretreatment and etching machine for microscopic observation.
Bulk analysis (quantitative analysis of solid materials) is also possible.

Responsible department

Installation Location 57 North Building 2 (partially located in the DuET experiment building in North Building 1)

Available Users

Kyoto University
Use -by-the-hour
Accepted only between 9 am and 5 pm off campus

Other Research Institutes
Use -by-the-hour
Accepted only between 9 am and 5 pm off campus

Companies, etc.
Public offering

Notes

Person of Kyoto University:Please contact the person in charge.

Usage rules

Others:Project Zero Emission Energy Research Please contact the person in charge.((Paid use and use under a joint research agreement are available.)
※ For details on how to apply, please refer to the device’s website.
http://www.iae.kyoto-u.ac.jp/zero_emission/

Inquiries

Advanced Energy Conversion Division Advanced Energy Structural Materials Research Section(Contact:Omura)
TEL
0774-38-3568
MAIL
ohmura.takamasa.2r*kyoto-u.ac.jp 
※Please change 「*」 to 「@」 and send.

USACO website
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