JPEN

Marcus-type high-frequency glow discharge surface analyzer (GDS) GD-Profiler 2

HORIBA, Ltd. 
  • Rapid surface analysis and surface analysis of non-conductive materials are also possible.
  • Pulse sputtering (patented) enables low-damage, high-resolution measurements.
  • It can be used as a pretreatment and etching machine for microscopic observation.
  • Bulk analysis (quantitative analysis of solid materials) is also possible.
Installation Location
57 Installation Location 57 North Building 2 (partially located in the DuET experiment building in North Building 1
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User Guide

Kyoto University
Use -by-the-hour

Accepted only between 9 am and 5 pm off campus

Other Research Institutes
Use -by-the-hour

Accepted only between 9 am and 5 pm off campus

Companies, etc.
Public offering
Use -by-the-hour
Users perform measurements on an hourly basis
public offering
Users perform the measurements on an hourly basis
User Guide
Person of Kyoto University:Please contact the person in charge.
Others:Project Zero Emission Energy Research Please contact the person in charge.
(Paid use and use under a joint research agreement are available.)
※ For details on how to apply, please refer to the device's website.
http://www.iae.kyoto-u.ac.jp/zero_emission/

Inquiries
Advanced Energy Conversion Division Advanced Energy Structural Materials Research Section(Contact:Omura)
TEL
0774-38-3568
MAIL
ohmura.takamasa.2r*kyoto-u.ac.jp

Please change 「*」 to 「@」 and send.

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