Infrared MAIRS thin film structure analysis device (pMAIRS, MAIRS2)

Thin film structure analysis system using the iS50 FT-IR with MAIRS measurement unit It is possible to analyze the molecular orientation of each functional group and the strength and direction of hydrogen bonds for thin films of up to 500 nm. Analyzing the anisotropy of surface modes of polarons, phonons, and polaritons is also possible. It is resistant to the surface roughness of thin films and can be performed with good reproducibility for rms values of 100 nm or less. (equipped with pMAIRS and MAIRS2)

Installation Location 27 N-307C (Joint Research Station), N Building

Kyoto University
Technical Assistance
Please consult with the person in charge in advance.

Other Research Institutes
Technical Assistance Collaborative investigation
Limited to joint research with the Institute for Chemical Research, Kyoto University
Please consult with the person in charge in advance.

Companies, etc.
Technical Assistance Collaborative investigation
Limited to joint research with the Institute for Chemical Research, Kyoto University
Please consult with the person in charge in advance.

Basically, users operate the device, but an assistant attends the use of the device.

Please contact the person in charge by e-mail.

Institute for Chemical Reasearch Division of Environmental Chemistry Chemistry for Functionalized Surfaces (Contact:Hasegawa)
MAIL
htakeshi*scl.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.