Scanning Transmission Electron Microscope (STEM) JEM-2100F
This device is equipped with a field emission electron gun that provides high brightness, high coherence, and stability, allowing for imaging and analysis at the nanoscale. There are two observation modes: TEM and STEM. In STEM mode, compositional analysis of the observed area can be performed using the accompanying energy-dispersive X-ray analysis (EDX) system for EDX mapping.
Chemical Engineering Department
(1) Individuals who belong to a department in the Graduate School of Engineering at Kyoto University (hereinafter referred to as “the university”).
(2) Faculty or students of the Graduate School of Engineering at Kyoto University who belong to departments other than the specified one.
(3) Faculty or students of Kyoto University who do not belong to the Graduate School of Engineering.
(4) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(5) Individuals engaged in research and development activities in companies or other organizations.
(6) Other individuals deemed appropriate by the responsible manager.
Attending the user training is necessary before the measurement. However, please note that the training sessions are held irregularly, so even if you make a reservation, you may not be able to use the facility immediately. Also, please refrain from measuring samples that contain a large amount of organic matter.
Chemical Engineering Department
Satoshi Watanabe
075-383-2682
nabe*cheme.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.