X-ray diffractometer SLX2000
In addition to the regular 2θ/ω or ω scan, it is capable of performing reciprocal lattice mapping, pole figure measurement, and reflectivity measurement. With high resolution in 2θ and ω, it is suitable for precise measurements.
Electronic Science and Engineering Department
(1) Individuals who belong to the Electronic Engineering Program (referred to as “the program”) in the Graduate School of Engineering at Kyoto University.
(2) Faculty or students of Kyoto University who do not belong to the category mentioned in the previous item.
(3) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(4) Individuals engaged in research and development activities in companies or other organizations.
(5) Other individuals deemed appropriate by the responsible manager.
Please attend the training session and perform the measurement by yourself.
Electronic Science and Engineering Department
Kawakami Laboratory
075-383-2309
xrd-yui*optomater.kuee.kyoto-u.ac.jp
※Please inform us of an overview of the usage (format optional) before submitting the application.
※Please change 「*」 to 「@」 and send.