Scanning electron microscope JSM6390LV
This device is a scanning electron microscope equipped with a high-performance super-conical objective lens that guarantees a resolution of 3nm at 30kV. It provides sharp images with high contrast. The new scanning system enables extremely low magnification observation of 8x or below, allowing for efficient field searching and navigation. The electron gun is fully automated, and with the zoom condenser lens, the image remains stable even when changing the acceleration voltage or sample current, making it intuitive to set the sample current.
Civil and Earth Resources Engineering Department
(1) Faculty or students of Kyoto University (hereinafter referred to as “the university”).
(2) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(3) Individuals engaged in research and development activities in companies or other organizations.
Limited to the observation of materials in the field of engineering. For other materials, please consult in advance and obtain approval.
Materials in wet conditions are difficult to observe.
Civil and Earth Resources Engineering Department
Yosuke Higo
075-383-3260
higo.yohsuke.5z*kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.