Focused ion beam / scanning electron microscope processing observation device
It allows for high-resolution SEM observation after high-speed cross-section processing using FIB (Focused Ion Beam). Additionally, it is capable of elemental mapping using an Energy-Dispersive X-ray Spectroscopy (EDS) system. (Optional: Sample pick-up system)
Material Chemistry Department
(1) Individuals who belong to the Management Program in the Graduate School of Engineering (referred to as “the graduate school”) at Kyoto University.
(2) Faculty or students of the graduate school mentioned in the previous item who belong to departments or programs other than the Management Program.
(3) Faculty or students of Kyoto University who do not belong to the graduate school mentioned in the previous item.
(4) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(5) Individuals engaged in research and development activities in companies or other organizations.
(6) Other individuals deemed appropriate by the responsible manager.
Before submitting a usage request, please make sure to inform the following contact information about the outline of your intended use and obtain approval.
Material Chemistry Department
Masahiro Shimizu
075-383-2463
shimizu.masahiro.3m*kyoto-u.ac.jp
http://func.mc.kyoto-u.ac.jp/
※Please make sure to inform us of an overview of the usage before submitting the application and obtain approval.
※Please change 「*」 to 「@」 and send.