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Ultra-fine periodic structure analysis system

Model
Manufacturer
Rigaku Co., Ltd.
Specification
Ultrafine Periodic Structure Analysis System
Location
Katsura Campus, Building A2 Basement 1st floor, Room 006(Incubation Core Lab)
Installation Year
2020
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Overview

We can analyze structures in solids and liquids ranging from 1 to 20 nm. Please contact us for more details. The detailed specifications are as follows:
Device Name: NANO-Viewer
Detector: HyPix-6000 Silicon Pixel Detector
Wavelength: 0.15 nm (CuKα)
Sample-detector distance: Variable (0.3-1.2 m)

Responsible department

Polymer Chemistry Department

Available Users

(1) Individuals who belong to the Management Program in the Graduate School of Engineering (referred to as “the graduate school”) at Kyoto University.
(2) Faculty or students of the graduate school mentioned in the previous item who belong to departments or programs other than the Management Program.
(3) Faculty or students of Kyoto University who do not belong to the graduate school mentioned in the previous item.
(4) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(5) Individuals engaged in research and development activities in companies or other organizations.
(6) Other individuals deemed appropriate by the responsible manager.

Notes

Requested measurements are not available. Only measurements conducted by the experimenter are possible. Attending training is mandatory for the first-time use. Prior contact with the responsible person is necessary before making a reservation to adjust the equipment in advance.

Usage rules
Inquiries

Polymer Chemistry Department
Akiyuki Ryouki
075-383-2626
ryouki.akiyuki.3r*kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.

Application for use
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