X-ray photoelectron spectrometer JPS-9010TRX
It is a device that analyzes the elemental composition, composition, and chemical state of a sample by irradiating it with characteristic X-rays and measuring the kinetic energy of the emitted photoelectrons. It can analyze only the surface of the sample since the analysis depth is approximately 10 nm from the sample surface. It can detect elements from Li and above, with a detection limit of approximately 0.1 at.%. It can determine the valence state of elements in the sample. It has a dedicated transfer vessel, allowing the transportation and introduction of samples from a glove box or similar environment without exposing them to the atmosphere. By etching the sample surface with an Ar ion gun, the internal composition of the sample can be exposed, enabling compositional analysis and analysis of the chemical state of elements in the depth direction of the sample.
Materials Sciences and Engineering Department
(1) Individuals who belong to a department or the Materials Science Course in the Department of Physics and Engineering in Kyoto University (hereinafter referred to as “the university”).
(2) Faculty or students of Kyoto University who belong to departments or courses other than the specified one.
(3) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(4) Individuals engaged in research and development activities in companies or other organizations.
(5) Other individuals deemed appropriate by the responsible manager.
Only requested measurements are available. Consultation will be conducted during the request. Measurement of hard magnetic materials is not possible. The usage limit per laboratory is 50 hours per year.
Materials Sciences and Engineering Department
Education Research Support Room
075-753-5474
xps*mtl.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.