Precision Ion Polishing System (PIPS) Model 691
This ion milling machine can prepare thin-film samples for TEM (transmission electron microscope) observation by irradiating the sample with an argon ion beam, knocking off surface atoms and milling the sample. Mechanical polishing and dimpling are required before using this machine. It can also perform flat milling for SEM observation.
Materials Sciences and Engineering Department
(1) Individuals who belong to a department or the Materials Science Course in the Department of Physics and Engineering in Kyoto University (hereinafter referred to as “the university”).
(2) Faculty or students of Kyoto University who belong to departments or courses other than the specified one.
(3) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(4) Individuals engaged in research and development activities in companies or other organizations.
(5) Other individuals deemed appropriate by the responsible manager.
Materials Sciences and Engineering Department
Kenji Kazumi
075-753-5474
kazumi.kenji.6r*kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.