JP EN

Dimple Grinder Model 656

Model
Model 656
Manufacturer
Gatan, Inc., USA
Specification
Sample polishing wheel rotation speed: 0 to 600 rpm, continuously variable Sample polishing load: 0 to 40 g, continuously variable Sample stage rotation speed: 10 rpm
Location
Yoshida Campus, Faculty of Engineering Engineering Science Depts Building 1st floor, Room 118
Installation Year
2003
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Overview

In the preparation of TEM (transmission electron microscope) samples using the ion milling method, a hemispherical depression is created in the sample by polishing using this equipment in the process prior to ion milling, and the sample is thinned to approximately 5-20 μm in the center while leaving some thickness at the edges to maintain strength.

Responsible department

Materials Sciences and Engineering Department

Available Users

(1) Individuals who belong to a department or the Materials Science Course in the Department of Physics and Engineering in Kyoto University (hereinafter referred to as “the university”).
(2) Faculty or students of Kyoto University who belong to departments or courses other than the specified one.
(3) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(4) Individuals engaged in research and development activities in companies or other organizations.
(5) Other individuals deemed appropriate by the responsible manager.

Notes
Usage rules
Inquiries

Materials Sciences and Engineering Department
Kenji Kazumi
075-753-5474
kazumi.kenji.6r*kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.

Application for use
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