Scanning Electron Microscope S-3500H
It is a scanning electron microscope equipped with a thermal electron gun that is used for surface morphology observation and compositional analysis of solid surfaces. It allows for observation of secondary electron images with a resolution of approximately 100 nm, detection of elements from Na and above with a detection limit of approximately 0.1 at.%, EDX analysis with an X-ray generation area of approximately 1 um for elements from B and above with a detection limit of approximately 0.01 at.%, and WDX analysis with an X-ray generation area of approximately 1 um for elements from B and above with a detection limit of approximately 0.01 at.%.
Materials Sciences and Engineering Department
(1) Individuals who belong to a department or the Materials Science Course in the Department of Physics and Engineering in Kyoto University (hereinafter referred to as “the university”).
(2) Faculty or students of Kyoto University who belong to departments or courses other than the specified one.
(3) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(4) Individuals engaged in research and development activities in companies or other organizations.
(5) Other individuals deemed appropriate by the responsible manager.
Please attend the preliminary training and perform the measurement by yourself.
Please provide the purpose of use and sample information (conductivity, composition, shape, quantity) to the contact information below.
Materials Sciences and Engineering Department
Nobuharu Sasaki
075-753-5426
sasaki.nobuharu.7a*kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.