Cryogenic high-resolution transmission electron microscope (JEM-2100F(G5))

Model

JEM-2100F(G5)

Manufacturer

JEOL Ltd.

Specification

Resolution 0.2 nmAccelerating voltage 200 kVHelium retention time on helium stage: 4 hoursElectron gun ZrO/W(100)FEGCCD Camera 2048x2048 pixelsFeatures: Observation is possible while keeping the sample temperature at liquid helium temperature. Equipped with a cryo-transfer mechanism, it is possible to freeze and introduce samples without exposing them to the outside air. Photographed using a CCD camera.

Location

Institute for Chemical Research Cryogenic Ultra High-Resolution Electron Microscope Room 9-2

Installation Year

2009

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Overview

Resolution 0.2 nm
Accelerating voltage 200 kV
Helium retention time on helium stage: 4 hours
Electron gun ZrO/W(100)FEG
CCD Camera 2048×2048 pixels
Features: Observation is possible while keeping the sample temperature at liquid helium temperature. Equipped with a cryo-transfer mechanism, it is possible to freeze and introduce samples without exposing them to the outside air. Photographed using a CCD camera.

Responsible department

Installation Location 33 Cryogenic Ultra High-Resolution Electron Microscope Room 9-2

Available Users

Kyoto University
Technical Agencies Technical Assistance Device Use
You must release a result

Other Research Institutes
Technical Agencies Technical Assistance Device Use
You must release a result

Companies, etc.
Technical Agencies Technical Assistance Device Use
You must release a result

Notes

Users should submit samples etc. Technical staff will measure them.

Usage rules

Kyoto University Microstructural Characterization Platform
http://tem.nanoplat.cpier.kyoto-u.ac.jp/

Inquiries

Division of Electron Microscopy and Crystal Chemistry,Institute for Chemical Research(Contact:Ogawa)
TEL
0774-38-3052
MAIL
arim*eels.kuicr.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.

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