Ultra-low accelerating voltage field emission scanning electron microscope (FE-SEM (ULTRA55))
Hitachi High-Tech GLOBAL
# crystal orientation analysis
# high magnification
# Electron microscope
# 電子顕微鏡
# FE－SEM
# 高倍率
# 結晶方位解析
- FE-SEM observation allows observation at a higher magnification than a scanning electron microscopy (SEM). This enables observation of surface irregularities, composition distribution, crystal particles, etc., and crystal orientation analysis using EBSD.
- Elemental analysis can also be performed using the energy-dispersive X-ray analyzer (EDX) attached to the FE-SEM.
Installation Location
57
Installation Location 57 North Building 2 (partially located in the DuET experiment building in North Building 1)
User Guide
Kyoto University
Use -by-the-hour
Accepted only between 9 am and 5 pm off campus
Other Research Institutes
Use -by-the-hour
Accepted only between 9 am and 5 pm off campus
Companies, etc.
Public offering
-
Use -by-the-hour
- Users perform measurements on an hourly basis
-
public offering
- Users perform the measurements on an hourly basis
User Guide
Person of Kyoto University：Please contact the person in charge.
Others：Project Zero Emission Energy Research Please contact the person in charge.（(Paid use and use under a joint research agreement are available.)
※ For details on how to apply, please refer to the device's website.
http://www.iae.kyoto-u.ac.jp/zero_emission/
Others：Project Zero Emission Energy Research Please contact the person in charge.（(Paid use and use under a joint research agreement are available.)
※ For details on how to apply, please refer to the device's website.
http://www.iae.kyoto-u.ac.jp/zero_emission/
Inquiries
Advanced Energy Conversion Division Advanced Energy Structural Materials Research Section（Contact:Omura)
- TEL
- 0774-38-3568
- ohmura.takamasa.2r＊kyoto-u.ac.jp
Please change 「＊」 to 「@」 and send.