Single-Crystal X-ray Diffractometer

Model

SC-XRD

Manufacturer

Rigaku Corporation

Specification

This system is a single-crystal X-ray structure analysis system designed for microcrystals, combining a high-brightness X-ray source with state-of-the-art detectors. Specifications X-ray Generator (High-Brightness): MicroMax-007 HF Output: 1.2 kW (50 kV, 24 mA) Target: Mo (Molybdenum) X-ray Optics: VariMax (X-ray focusing mirrors) Detector: HyPix-6000HE or PILATUS200K (Hybrid Pixel Array Detector) Cryosystem: Oxford Cobra (capable of cooling down to 80 K) Control & Analysis Software: CrysAlisPro (Integrated software for data collection and structural analysis)

Location

Main Building M166-C

Installation Year

2024

Overview

English Description This system is designed to precisely determine the three-dimensional arrangement of atoms and molecules. Key Features

Microcrystal Capability By employing a high-brightness X-ray source and focusing mirrors, the system enables measurement and structure determination of extremely small crystals—down to a few tens of micrometers (0.01mm). This allows for the analysis of samples that are near the lower limit of shape recognition under an optical microscope.
High-Speed Data Collection Equipped with a high-sensitivity hybrid pixel detector, the system can collect a complete set of diffraction data required for structural analysis in a short timeframe—typically ranging from half a day to one day per sample.
High-Precision Analytical Environment The integration of the Cobra cryosystem allows for high-resolution data acquisition by minimizing thermal vibration. Furthermore, it effectively reduces radiation damage (such as radical reactions) caused by X-ray exposure, ensuring more reliable results.

Responsible department

Institute for Chemical Research (ICR)W-Blook 112C

Available Users

Eligible Users:

Kyoto University faculty, staff, and students

External academic and research institutions

Corporate/Private sector entities

Usage Inquiries: Open for consultation (Please contact us for details).

Notes

Guidelines for Use

Prior to using the equipment, users must be registered as X-ray equipment operators at their respective home institutions. After registration, please contact the staff in charge to submit the “X-ray Worker Application Form” specifically for this system in advance. Additionally, a dosimeter must be worn at all times during operation.

Usage rules

Regulations on the Shared Use of Facilities at the Uji Campus Equipment Support Center(Updated February 2026)

Inquiries

Institute for Chemical Research (ICR) ((Contact:Tanijfuji)

TEL：0774-38-3029
MAIL：tanifuji.kazuki.6u*kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.

USACO/Katsura Yui/MaCBES
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