Ion Slicer EM-09100IS
This ion milling device can produce thin-film samples that can be observed with a TEM (transmission electron microscope) by irradiating the sample with an argon ion beam, knocking off atoms on the surface and grinding the sample. Mechanical polishing is required as a step before using this device, but this mechanical polishing is simpler than with other ion milling devices. It can also be used as a cross-section polisher (a cross-section milling device for SEM observation).
Materials Sciences and Engineering Department
(1) Individuals who belong to a department or the Materials Science Course in the Department of Physics and Engineering in Kyoto University (hereinafter referred to as “the university”).
(2) Faculty or students of Kyoto University who belong to departments or courses other than the specified one.
(3) Individuals affiliated with national or local government bodies, national university corporations or university joint-use institutions, independent administrative institutions, or corporations or organizations engaged in educational or research activities.
(4) Individuals engaged in research and development activities in companies or other organizations.
(5) Other individuals deemed appropriate by the responsible manager.
Materials Sciences and Engineering Department
Kenji Kazumi
075-753-5474
kazumi.kenji.6r*kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.