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IAE
Field emission transmission electron microscope (FE-TEM(JEM-2200FS)…
IAE
Ultra-low accelerating voltage field emission scanning electron microsco…
IAE
Focused ion beam processing and observation device (FIB (FB-2200))…
IAE
Field emission electron probe analyzer (FE-EPMA(JXA-8500FK))
IAE
Sample horizontal type strong X-ray diffractometer RINT-TTR III …
IAE
Marcus-type high-frequency glow discharge surface analyzer (GDS) GD-Prof…
IAE
Ion milling device for FIB post-processing NanoMill Model1040…
IAE